Scanning probe methods: From high-resolution imaging to nanoscale additive manufacturing

Scanning probe methods: From high-resolution imaging to nanoscale additive manufacturing

Author(s): Simon Sprengel, Dmitry Momotenko

Publication: Bunsen-Magazin 2025, 3, 136-138 

Publisher: Deutsche Bunsen-Gesellschaft für physikalische Chemie e.V., Frankfurt

Language: English

Abstract: From pioneering raster images with atomic resolution to fabrication of 3D micro- and nanostructures, scanning probe microscopy (SPM) has evolved from mapping to nanoscale patterning tool. This article outlines how modern electrochemical SPM techniques are pushing the boundaries of additive manufacturing, enabling automated, free-form, and high-resolution metal printing at the micro- and nanoscale.

Cite this:  S. Sprengel, D. Momotenko, Bunsen-Magazin 2025, 3, 136-138

Get the full article (pdf)