Piezoresponse Force Microscopy for Novel Computing Components

Piezoresponse force microscopy for novel computing components

Author(s): Ilka Hermes

Publication: Bunsen-Magazin 2025, 3, 116-118

Publisher: Deutsche Bunsen-Gesellschaft für physikalische Chemie e.V., Frankfurt

Language: English

DOI: 10.26125/a870-m218

Abstract: In the future, ferroelectric components, such as ferroelectric field-effect transistors or tunnel junctions, could act as building blocks in novel computing concepts. These applications require an in-depth understanding of the used materials, from domain structure to polarization switching behavior. Piezoresponse force microscopy, a functional atomic force microscopy technique, can access this information with a nanoscale resolution and even manipulate or tailor customized domain patterns.

Cite this:  I. Hermes, Bunsen-Magazin 2025, 3, 116-118, DOI: 10.26125/a870-m218

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